Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy
نویسندگان
چکیده
The determination of optical constants (i.e., real and imaginary parts the complex refractive index (nc) thickness (d)) ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields product nc d) film, while AFM yield its thickness, thereby allowing separate d. In this paper, we use to determine very thin 58 nm) dye-doped polymers at different dye/polymer concentrations (a feature which constitutes originality work), compare results those obtained using spectroscopic ellipsometry measurements performed on same samples. To properties our film samples ellipsometry, used, theoretical fits experimental data, Bruggeman’s effective medium model dye/polymer, assumed as a composite material, Lorentz dye absorption. We found an excellent agreement between confirming that appropriate measuring coatings single light frequency, given it simpler operation data analysis than ellipsometry.
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ژورنال
عنوان ژورنال: Photonics
سال: 2021
ISSN: ['2304-6732']
DOI: https://doi.org/10.3390/photonics8020041